Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces

by Dror Sarid (Author)

Imported Edition

Delivered in 14-21 working days

Free shipping

Online price: ₹Rs12,180 ₹Rs11,815

You save ₹Rs365

Login/Register to add this product to a wishlist.

You will be asked to pay the full amount when your item is delivered. Only cash is accepted for this type of order. Pay Cash on Delivery

Format: Hardcover

Synopsis of Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic...

This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.

Product details

  • Pages: 282
  • Publisher: Oxford University Press Inc
  • Published: 25th August 1994
  • Language: English
  • ISBN: 9780195092042
  • Category: Science

Reviews of Scanning Force Microscopy: With Applications to Electric, Magnetic and Atomic Forces

Read customer reviews on this product. If you have read this book, why not post your own review?

Be the first to review this product

Also by Dror Sarid

Recently viewed by you

Wishlist (x items)
  • hello
Compare (0 items, 0 selected)
Compare selected Deselect all Remove all

Only items of the same type can be compared.