Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

by Ray Egerton (Author)

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Format: Hardcover

Synopsis of Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM

Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and inner space. Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.

Product details

  • Pages: 216
  • Publisher: Springer-Verlag New York Inc.
  • Published: 1st May 2008
  • Language: English
  • ISBN: 9780387258003
  • Category: Science

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