Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope: Volume 159

by Peter W. Hawkes (Editor)

Imported Edition

Delivered in 14-21 working days

Free shipping

Online price: Rs12,544 Rs12,168

You save Rs376

Login/Register to add this product to a wishlist.

You will be asked to pay the full amount when your item is delivered. Only cash is accepted for this type of order. Pay Cash on Delivery

Format: Hardcover

Synopsis of Advances in Imaging and Electron Physics: The Scanning Transmission Electron...

Advances in Imaging and Electron Physics merges two long-running serials - Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy . This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. This particular volume presents several timely articles on the scanning transmission electron microscope. Updated with contributions from leading international scholars and industry experts, it discusses hot topic areas and presents current and future research trends. It also provides an invaluable reference and guide for physicists, engineers and mathematicians.

Product details

  • Pages: 320
  • Publisher: Elsevier Science Publishing Co Inc
  • Published: 30th November 2009
  • Language: English
  • ISBN: 9780123749864
  • Category: Science

Reviews of Advances in Imaging and Electron Physics: The Scanning Transmission Electron Microscope: Volume 159

Read customer reviews on this product. If you have read this book, why not post your own review?

Be the first to review this product

Recently viewed by you

Wishlist (x items)
  • hello
Compare (0 items, 0 selected)
Compare selected Deselect all Remove all

Only items of the same type can be compared.